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Consultronix has developed Instrumentation for data acquisition and measurement of semiconductor parameters, control and testing of semiconductor optical devices and testing / characterizing MEMS devices at the wafer level in concert with an automated wafer prober.
We can perform data acquisition up to 24-bit resolution as needed with 16-bit being the more common choice. We develop programmable current sources and voltage sources to excite test devices and crystal-controlled digital timing devices to control measurement time-base accuracy.
We typically write or assist in the creation of a test specification, establish the best way to acquire the data needed to achieve the desired results and design the hardware and software to perform the tests and display the data in both graphical and tabular formats.
These test systems are customized to achieve optimum results for your specific test requirements.
Some of the more recent systems developed are:
 A semiconductor thermal characterization system to establish thermal parameters for complete packaged devices.
A test system for the measurement of MEMS bridge sensor devices. Bridge resistance, matching, leakage parameters and graphical display of failure analysis and resistance distribution.
An interface control and measurement system for an optical switching silicon device.
Examples: Thermal Tester Sensor Probe Tester
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